• DocumentCode
    2801535
  • Title

    An efficient method for terminal reduction of interconnect circuits considering delay variations

  • Author

    Liu, Pu ; Tan, Sheldon X D ; Li, Hang ; Qi, Zhenyu ; Kong, Jun ; McGaughy, Bruce ; He, Lei

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Riverside, CA, USA
  • fYear
    2005
  • fDate
    6-10 Nov. 2005
  • Firstpage
    821
  • Lastpage
    826
  • Abstract
    This paper proposes a novel method to efficiently reduce the terminal number of general linear interconnect circuits with a large number of input and/or output terminals considering delay variations. Our new algorithm is motivated by the fact that VLSI interconnect circuits have many similar terminals in terms of their timing and delay metrics due to their closeness in structure or due to mathematic approximation using meshing in finite difference or finite element scheme during the extraction process. By allowing some delay tolerance or variations, we can reduce many similar terminals and keep a small number of representative terminals. After terminal reduction, traditional model order reduction methods can achieve more compact models and improve simulation efficiency. The new method, TermMerg, is based on the moments of the circuits as the metrics for the timing or delay. It then employs singular value decomposition (SVD) method to determine the optimum number of clusters based on the low-rank approximation. After this, the K-means clustering algorithm is used to cluster the moments of the terminals into different clusters. Experimental results on a number of real industry interconnect circuits demonstrate the effectiveness of the proposed method.
  • Keywords
    delays; finite difference methods; finite element analysis; integrated circuit interconnections; integrated circuit modelling; singular value decomposition; timing; K-means clustering algorithm; VLSI interconnect circuits; delay metrics; delay tolerance; delay variations; extraction process; finite difference scheme; finite element scheme; linear interconnect circuits; low-rank approximation; model order reduction methods; singular value decomposition method; terminal reduction; timing metrics; Approximation algorithms; Circuit simulation; Delay; Finite difference methods; Finite element methods; Integrated circuit interconnections; Mathematics; Singular value decomposition; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
  • Print_ISBN
    0-7803-9254-X
  • Type

    conf

  • DOI
    10.1109/ICCAD.2005.1560176
  • Filename
    1560176