• DocumentCode
    2801651
  • Title

    Breaching the kT/q limit with dopant segregated Schottky barrier resonant tunneling MOSFETs: A computationnal study

  • Author

    Afzalian, Aryan ; Flandre, Denis

  • Author_Institution
    Microelectron. Lab., Univ. Catholique de Louvain, Louvain-La-Neuve, Belgium
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    376
  • Lastpage
    379
  • Abstract
    We study here, using non-equilibrium Green´s function quantum simulations, the impact of dopant segregation (DS) on Schottky barrier (SB) nanoscale transistors for the implementation of ultimate CMOS with low series resistance and steep slope. Owing to their adequate multi-barrier structure, DS-SB transistor can present a gate modulated barrier resonant tunneling (MBRT) effect that allows them to breach the kT/q subthreshold slope limit of classical MOSFET, and therefore pave a way towards steep slope, low S/D resistance electronics. In order to reach their ultimate on-current performances however, new materials with lower SB height and/or means to implant and activate ultra high dopant segregation levels (in the order 1021 cm-3) will be needed, especially when considering that Schottky barrier height will be increased through quantum confinement.
  • Keywords
    Green´s function methods; MOSFET; Schottky barriers; resonant tunnelling; segregation; semiconductor doping; CMOS; DS-SB transistor; MBRT; MOSFET; SB nanoscale transistor; Schottky barrier resonant tunneling; dopant segregation; gate modulated barrier resonant tunneling; nonequilibrium Green´s function quantum simulation; quantum confinement; Immune system; Logic gates; Resonant tunneling devices; Schottky barriers; Semiconductor process modeling; Silicon; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
  • Conference_Location
    Sevilla
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-6658-0
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2010.5618206
  • Filename
    5618206