DocumentCode
2802006
Title
A cache-defect-aware code placement algorithm for improving the performance of processors
Author
Ishihara, Tohru ; Fallah, Farzan
Author_Institution
Adv. CAD Technol., Fujitsu Labs. of America, Inc., Sunnyvale, CA, USA
fYear
2005
fDate
6-10 Nov. 2005
Firstpage
995
Lastpage
1001
Abstract
Yield improvement through exploiting fault-free sections of defective chips is a well-known technique (Koren and Singh (1990) and Stapper et al. (1980)). The idea is to partition the circuitry of a chip in a way that fault-free sections can function independently. Many fault tolerant techniques for improving the yield of processors with a cache memory have been proposed. In this paper, we propose a defect-aware code placement technique which offsets the performance degradation of a processor with a defective cache memory. To the best of our knowledge, this is the first compiler-based technique which offsets the performance degradation due to cache defects. Experiments demonstrate that the technique can compensate the performance degradation even when 5% of cache lines are faulty. In some cases the technique was able to offset the impact even in presence of 25% faulty cache-lines.
Keywords
cache storage; fault tolerant computing; microprocessor chips; cache defect; cache memory; cache-defect-aware code placement algorithm; compiler-based technique; fault tolerant computing; fault-free section; faulty cache-line; microprocessor chips; processor performance degradation; Cache memory; Circuit faults; Degradation; Error correction codes; Fault tolerance; Laboratories; Logic arrays; Logic design; Microprocessors; Partitioning algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Print_ISBN
0-7803-9254-X
Type
conf
DOI
10.1109/ICCAD.2005.1560207
Filename
1560207
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