• DocumentCode
    2802079
  • Title

    Electrostatics of 3D carbon nanotube field-effect transistors

  • Author

    Neophytou, N. ; Jing Guo ; Lundstorm, M.

  • Author_Institution
    Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    175
  • Lastpage
    176
  • Abstract
    The electrostatics of a three-dimensional CNFET structure is studied. The paper is an extension to 3D structures, of previous work done for 2D structures. Previous work has shown that one-dimensional channels experience long range doping by the gate and contact electrodes and are very sensitive to the electrostatic environment. We examine how the three-dimensional environment affects the charge transfer from the metal contacts into a 30nm short intrinsic, semiconducting CNT, along the length of the tube under equilibrium conditions.
  • Keywords
    carbon nanotubes; electrostatics; field effect transistors; 30 nm; 3d carbon nanotube field-effect transistors; CNFET structure; charge transfer; electrostatics; Electrostatic analysis; FETs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
  • Conference_Location
    West Lafayette, IN, USA
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/IWCE.2004.1407383
  • Filename
    1407383