DocumentCode :
2802154
Title :
Simulation-based bug trace minimization with BMC-based refinement
Author :
Chang, Kai-Hui ; Bertacco, Valeria ; Markov, Igor L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, IL, USA
fYear :
2005
fDate :
6-10 Nov. 2005
Firstpage :
1045
Lastpage :
1051
Abstract :
Finding the cause of a bug can be one of the most time-consuming activities in design verification. This is particularly true in the case of bugs discovered in the context of a random simulation- based methodology, where bug traces, or counter-examples, may contain several hundred thousand cycles. In this work we propose Butramin, a bug trace minimizer. Butramin considers a bug trace produced by a random simulator or a semi-formal verification software and produces an equivalent trace of shorter length. Butramin applies a range of minimization techniques, deploying both simulation-based and formal methods, with the objective of producing highly reduced traces that still expose the original bug. We evaluated Butramin on a range of designs, including the publicly available picoJava microprocessor. Our experiments show that in most cases Butramin is able to reduce traces to a small fraction of their initial size, in terms of cycle length and signals involved.
Keywords :
circuit CAD; circuit simulation; equivalent circuits; formal verification; integrated circuit design; BMC-based refinement; Butramin; bug trace minimizer; equivalent trace; picoJava microprocessor; random simulator; semi-formal verification software; simulation-based bug trace minimization; Analytical models; Computer bugs; Context modeling; Costs; Economic forecasting; Electronic design automation and methodology; Integrated circuit synthesis; Microprocessors; Minimization methods; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Print_ISBN :
0-7803-9254-X
Type :
conf
DOI :
10.1109/ICCAD.2005.1560216
Filename :
1560216
Link To Document :
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