• DocumentCode
    2802186
  • Title

    Simulation of Si and Ge UTB MOSFETs using Monte Carlo method based on the quantum Boltzmann equation

  • Author

    Gang Du ; Xiaoyan Liu ; Zhiliang Xia ; Ruqi Han

  • Author_Institution
    Inst. of Microelectron., Peking Univ., Beijing, China
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    186
  • Lastpage
    187
  • Abstract
    As the CMOS technology scaling down to sub 0.1 /spl mu/m region, the quantum effects become obvious. From quantum kinetics equation and Wigner distribution function, the quantum Boltzmann equation (QBE) is investigated by Haug and Jauho (1998), Hansch (1991) and Tsuchiya and Miyoshi (1999). Comparing to semi-classical Boltzmann equation (BTE), quantum potential according to Haug and Jauho (1998), Hansch (1991) and Tsuchiya and Miyoshi (1999) and collision broadening according to Haug and Jauho (1998), Jauho and Reggiani (1988) and Register and Hess (1999) are two of the key QM effects in QBE that describe the quantum effect in real space and momentum space respectively. In this paper the QBE is solved using self-consistent ensemble full band Monte Carlo (MC) method by Jungemann (1999), and the Si and Ge UTB MOSFET is simulated use this method.
  • Keywords
    Boltzmann equation; MOSFET; Monte Carlo methods; germanium; quantum computing; silicon; Ge; Monte Carlo method; Si; UTB MOSFET; collision broadening; quantum Boltzmann equation; quantum potential; Boltzmann equation; Germanium; MOSFETs; Monte Carlo methods; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
  • Conference_Location
    West Lafayette, IN, USA
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/IWCE.2004.1407389
  • Filename
    1407389