• DocumentCode
    280222
  • Title

    Specification capture and yield enhancement in an interactive environment

  • Author

    De Boer, Rik ; Jennings, Paul ; Rankin, Paul

  • Author_Institution
    Interactive Solutions Ltd., London, UK
  • fYear
    1990
  • fDate
    33042
  • Firstpage
    42401
  • Lastpage
    42405
  • Abstract
    Describes a new tool for the analogue circuit designer, a tool concerned particularly with component tolerances and the unwanted effect these have on the performance of a mass-produced circuit. It assists in the redesign of a circuit to increase the manufacturing yield and reduce component costs. Like some conventional tools, this one simulates the effect of component variations on circuit performance and, by checking against performance specifications, estimates the manufacturing yield. Unlike others, however, it not only provides the designer with diagnostic information regarding especially sensitive parameters and specifications, but will also automatically adjust the nominal values of components in order to maximise the yield. Any parameter, such as the width of a device or the value of a resistor, may be designated as adjustable by the designer
  • Keywords
    analogue circuits; circuit CAD; interactive systems; analogue circuit designer; circuit performance; component tolerances; diagnostic information; interactive environment; manufacturing yield; mass-produced circuit; nominal values; yield enhancement;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Analogue IC Design: Obstacles and Opportunities, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    190425