DocumentCode
280222
Title
Specification capture and yield enhancement in an interactive environment
Author
De Boer, Rik ; Jennings, Paul ; Rankin, Paul
Author_Institution
Interactive Solutions Ltd., London, UK
fYear
1990
fDate
33042
Firstpage
42401
Lastpage
42405
Abstract
Describes a new tool for the analogue circuit designer, a tool concerned particularly with component tolerances and the unwanted effect these have on the performance of a mass-produced circuit. It assists in the redesign of a circuit to increase the manufacturing yield and reduce component costs. Like some conventional tools, this one simulates the effect of component variations on circuit performance and, by checking against performance specifications, estimates the manufacturing yield. Unlike others, however, it not only provides the designer with diagnostic information regarding especially sensitive parameters and specifications, but will also automatically adjust the nominal values of components in order to maximise the yield. Any parameter, such as the width of a device or the value of a resistor, may be designated as adjustable by the designer
Keywords
analogue circuits; circuit CAD; interactive systems; analogue circuit designer; circuit performance; component tolerances; diagnostic information; interactive environment; manufacturing yield; mass-produced circuit; nominal values; yield enhancement;
fLanguage
English
Publisher
iet
Conference_Titel
Analogue IC Design: Obstacles and Opportunities, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
190425
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