Title :
IEE Colloquium on `Analogue IC Design: Obstacles and Opportunities´ (Digest No.107)
Abstract :
The following topics were dealt with: CAD; layout; testing; signal processing; applications
Keywords :
analogue circuits; circuit CAD; linear integrated circuits; CAD; applications; layout; signal processing; testing;
Conference_Titel :
Analogue IC Design: Obstacles and Opportunities, IEE Colloquium on
Conference_Location :
London
