• DocumentCode
    2802490
  • Title

    Thermal performance of power packages-single-inline package as a case study

  • Author

    Chambers, Ben ; Mahilingam, M.

  • Author_Institution
    Motorola Inc., Phoenix, AZ, USA
  • fYear
    1992
  • fDate
    3-5 Feb 1992
  • Firstpage
    83
  • Lastpage
    88
  • Abstract
    The authors focus on the experimental results obtained from thermal resistance measurements made on 23 lead single-in-line (SIP-23) power packages. The experimental techniques employed in making the measurements are reviewed followed by a presentation of the experimental results. A generalized discussion is included of the effects of the various parameters on the package´s thermal performance. These results are compared to other similar power packages such as the TO-218 and TO-220 discrete device packages. Some simple empirical models which may be of value to system designers are included
  • Keywords
    packaging; power integrated circuits; thermal resistance; SIP-23; empirical models; single in line power packages; smart power; thermal performance; thermal resistance; Clamps; Computer aided software engineering; Electrical resistance measurement; Force measurement; Manufacturing processes; Plastic packaging; Resistance heating; Semiconductor device packaging; Thermal force; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0500-0
  • Type

    conf

  • DOI
    10.1109/STHERM.1992.172855
  • Filename
    172855