DocumentCode
2802490
Title
Thermal performance of power packages-single-inline package as a case study
Author
Chambers, Ben ; Mahilingam, M.
Author_Institution
Motorola Inc., Phoenix, AZ, USA
fYear
1992
fDate
3-5 Feb 1992
Firstpage
83
Lastpage
88
Abstract
The authors focus on the experimental results obtained from thermal resistance measurements made on 23 lead single-in-line (SIP-23) power packages. The experimental techniques employed in making the measurements are reviewed followed by a presentation of the experimental results. A generalized discussion is included of the effects of the various parameters on the package´s thermal performance. These results are compared to other similar power packages such as the TO-218 and TO-220 discrete device packages. Some simple empirical models which may be of value to system designers are included
Keywords
packaging; power integrated circuits; thermal resistance; SIP-23; empirical models; single in line power packages; smart power; thermal performance; thermal resistance; Clamps; Computer aided software engineering; Electrical resistance measurement; Force measurement; Manufacturing processes; Plastic packaging; Resistance heating; Semiconductor device packaging; Thermal force; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
Conference_Location
Austin, TX
Print_ISBN
0-7803-0500-0
Type
conf
DOI
10.1109/STHERM.1992.172855
Filename
172855
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