Title :
Transient thermal measurements using thermooptic and thermoelectric effects
Author :
Lee, Chin C. ; Su, Tsu J. ; Chao, Mingcher
Author_Institution :
Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Abstract :
Two techniques for transient thermal measurements are presented. The measured thermal responses are compared with the response calculated using a 3-dimensional transient temperature solution derived previously. One measurement technique employs the thermooptic effect of the change of optical index of refraction with temperature. Even though this change is very small, in the range of 10-5/°C, its effect can be transformed into a large variation in the optical signal by proper design. The other method utilizes the thermoelectric effect of electrical resistance change with temperature. This change is in the range of 4×10-3/°C, adequate to provide a signal for measurement. The intrinsic response time of both techniques is a few nanoseconds, thus providing a means to study the rapid initial temperature rise caused by a step source power
Keywords :
temperature distribution; thermal variables measurement; thermo-optical effects; thermoelectric devices; 3D transient temperature solution; optical refractive index; rapid initial temperature rise; step source power; thermal responses; thermoelectric effects; thermooptic effect; transient thermal measurements; Delay; Electric resistance; Electrical resistance measurement; Measurement techniques; Optical design; Optical refraction; Signal design; Temperature; Thermoelectricity; Thermooptic effects;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0500-0
DOI :
10.1109/STHERM.1992.172866
