Transient thermal measurements using thermooptic and thermoelectric effects

Author

Lee, Chin C. ; Su, Tsu J. ; Chao, Mingcher

Author_Institution

Electr. & Comput. Eng., California Univ., Irvine, CA, USA

fYear

1992

fDate

3-5 Feb 1992

Firstpage

41

Lastpage

46

Abstract

Two techniques for transient thermal measurements are presented. The measured thermal responses are compared with the response calculated using a 3-dimensional transient temperature solution derived previously. One measurement technique employs the thermooptic effect of the change of optical index of refraction with temperature. Even though this change is very small, in the range of 10^-5/°C, its effect can be transformed into a large variation in the optical signal by proper design. The other method utilizes the thermoelectric effect of electrical resistance change with temperature. This change is in the range of 4×10^-3/°C, adequate to provide a signal for measurement. The intrinsic response time of both techniques is a few nanoseconds, thus providing a means to study the rapid initial temperature rise caused by a step source power

Keywords

temperature distribution; thermal variables measurement; thermo-optical effects; thermoelectric devices; 3D transient temperature solution; optical refractive index; rapid initial temperature rise; step source power; thermal responses; thermoelectric effects; thermooptic effect; transient thermal measurements; Delay; Electric resistance; Electrical resistance measurement; Measurement techniques; Optical design; Optical refraction; Signal design; Temperature; Thermoelectricity; Thermooptic effects;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE

Conference_Location

Austin, TX

Print_ISBN

0-7803-0500-0

Type

conf

DOI

10.1109/STHERM.1992.172866

Filename

172866