DocumentCode

2802738

Title

Reliability consideration for advanced microelectronics

Author

Kayali, Sammy

Author_Institution

California Institute of Technology

fYear

2000

fDate

2000

Firstpage

99

Lastpage

99

Keywords

Microelectronics;

fLanguage

English

Publisher

ieee

Conference_Titel

Dependable Computing, 2000. Proceedings. 2000 Pacific Rim International Symposium on

Print_ISBN

0-7695-0975-4

Type

conf

DOI

10.1109/PRDC.2000.897290

Filename

897290