DocumentCode
2802806
Title
Neutron induced damage in linear integrated circuits: Ionizing effects contribution
Author
Azaïs, B. ; Lopez, D. ; Vie, M.
Author_Institution
Centre d´´Etudes de Gramat, France
fYear
1997
fDate
15-19 Sep 1997
Firstpage
234
Lastpage
239
Abstract
This work deals with the impact of ionizing dose induced damage in linear junction isolated integrated circuits (JIICs) when exposed to neutron irradiations. A very low contribution of ionizing effects is shown for standard neutron test conditions
Keywords
analogue integrated circuits; isolation technology; neutron effects; ionizing dose; linear junction isolated integrated circuit; neutron irradiation damage; Analog integrated circuits; Atomic measurements; Fission reactors; Fusion power generation; Inductors; Ion accelerators; Ionization; Neutrons; Silicon compounds; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location
Cannes
Print_ISBN
0-7803-4071-X
Type
conf
DOI
10.1109/RADECS.1997.698898
Filename
698898
Link To Document