• DocumentCode
    2802812
  • Title

    Detection of clustered microcalcifications using spatial point process modeling

  • Author

    Jing, Hao ; Yang, Yongyi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2009
  • fDate
    June 28 2009-July 1 2009
  • Firstpage
    81
  • Lastpage
    84
  • Abstract
    We propose a spatial point process approach to improve the detection accuracy of clustered microcalcifications (MCs) in mammogram images. The conventional approach to MC detection has been to first detect the individual MCs in an image independently, which are subsequently grouped into clusters. Our proposed approach aims to exploit the spatial distribution among the different MCs directly during the detection process. We model the MCs by a marked point process (MPP) in which spatially neighboring MCs interact with each other. The MCs are then simultaneously detected through maximum a posteriori (MAP) estimation of the model parameters of the MPP process. The proposed approach was evaluated with a dataset of 141 clinical mammograms from 66 cases, and the results show that it could yield improved detection performance compared to a recently proposed SVM detector.
  • Keywords
    biomineralisation; diagnostic radiography; image recognition; mammography; maximum likelihood estimation; medical image processing; SVM detector comparison; clustered microcalcification detection; mammogram images; marked point process; maximum a posteriori estimation; microcalcification spatial distribution; model parameter estimation; spatial point process modeling; Breast cancer; Calcium; Cancer detection; Clustering algorithms; Detectors; Image processing; Lesions; Object detection; Support vector machine classification; Support vector machines; Clustered microcalcifications; computer-aided detection; marked point process; spatial point process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-3931-7
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2009.5192988
  • Filename
    5192988