Title :
Dependable VLSI Program in Japan: Program Overview and the Current Status of Dependable VLSI Platform Project
Author :
Onodera, Hidetoshi
Author_Institution :
Dept. Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
Abstract :
Technology scaling and growing complexity have an increasing impacton the resilience of VLSI circuits and systems. Severe challenges have been emerging for the realization of dependable VLSI circuits and systems with required reliability and security. For coping with the increasing threats to dependability of VLSIs, the Dependable VLSI (DVLSI) program has been established in 2007 and 11 projects are now in progress. This paper gives an overview of the DVLSI program, followed by a brief introduction of one of the 11 projects entitled ``Dependable VLSI Platform using Robust Fabrics´´.
Keywords :
VLSI; integrated circuit reliability; scaling circuits; Japan; VLSI circuits; dependable VLSI platform project; dependable VLSI program; growing complexity; reliability; robust fabrics; security; technology scaling; Arrays; Educational institutions; Microprocessors; Reliability; Resilience; Very large scale integration;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.56