Abstract :
The following topics are dealt with: clock testing; timing testing; power aware testing; defect based test technique; online testing; microprocessor testing; 3D IC testing; fault diagnosis; post-silicon debug; test compression; test quality improvement; RF signal testing; mixed signal testing; test automation; advanced memory test technique; DFT solution; BIST; nanoscale technology; 3D integrated circuit yield; 3D integrated circuit design; low power design; embedded tutorial testability; cryptographic hardware; hardware Trojan detection; and system level testing.
Keywords :
built-in self test; clocks; cryptography; fault diagnosis; integrated circuit design; integrated circuit testing; integrated circuit yield; microprocessor chips; mixed analogue-digital integrated circuits; 3D IC testing; 3D integrated circuit design; 3D integrated circuit yield; BIST; DFT solution; RF signal testing; advanced memory test technique; clock testing; cryptographic hardware; defect based test technique; embedded tutorial testability; fault diagnosis; hardware Trojan detection; low power design; microprocessor testing; mixed signal testing; nanoscale technology; online testing; post-silicon debug; power aware testing; system level testing; test automation; test compression; test quality improvement; timing testing;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
