Title :
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost
Author :
Arslan, Baris ; Orailoglu, Alex
Author_Institution :
Comput. Sci. & Eng., Univ. of California, San Diego, San Diego, CA, USA
Abstract :
Defect characteristics and consequently test quality vary throughout the production life cycle. An optimal test methodology needs to adjust the test set based on the ever changing defect characteristics to deliver consistent test quality levels. In this paper, we propose an adaptive test framework that alters the test set continuously by utilizing the history of recent failures to track the instantaneous defect escape level, thus reaching the target test quality level at minimal test cost.
Keywords :
automatic test pattern generation; adaptive test framework; instantaneous defect escape level; production life cycle; target test quality; Accuracy; Adaptation models; Data models; Estimation; Mathematical model; Production; Testing; adaptive test; test cost; test optimization; test quality;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.91