• DocumentCode
    2803516
  • Title

    Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost

  • Author

    Arslan, Baris ; Orailoglu, Alex

  • Author_Institution
    Comput. Sci. & Eng., Univ. of California, San Diego, San Diego, CA, USA
  • fYear
    2011
  • fDate
    20-23 Nov. 2011
  • Firstpage
    323
  • Lastpage
    328
  • Abstract
    Defect characteristics and consequently test quality vary throughout the production life cycle. An optimal test methodology needs to adjust the test set based on the ever changing defect characteristics to deliver consistent test quality levels. In this paper, we propose an adaptive test framework that alters the test set continuously by utilizing the history of recent failures to track the instantaneous defect escape level, thus reaching the target test quality level at minimal test cost.
  • Keywords
    automatic test pattern generation; adaptive test framework; instantaneous defect escape level; production life cycle; target test quality; Accuracy; Adaptation models; Data models; Estimation; Mathematical model; Production; Testing; adaptive test; test cost; test optimization; test quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2011 20th Asian
  • Conference_Location
    New Delhi
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4577-1984-4
  • Type

    conf

  • DOI
    10.1109/ATS.2011.91
  • Filename
    6114750