DocumentCode
2803516
Title
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost
Author
Arslan, Baris ; Orailoglu, Alex
Author_Institution
Comput. Sci. & Eng., Univ. of California, San Diego, San Diego, CA, USA
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
323
Lastpage
328
Abstract
Defect characteristics and consequently test quality vary throughout the production life cycle. An optimal test methodology needs to adjust the test set based on the ever changing defect characteristics to deliver consistent test quality levels. In this paper, we propose an adaptive test framework that alters the test set continuously by utilizing the history of recent failures to track the instantaneous defect escape level, thus reaching the target test quality level at minimal test cost.
Keywords
automatic test pattern generation; adaptive test framework; instantaneous defect escape level; production life cycle; target test quality; Accuracy; Adaptation models; Data models; Estimation; Mathematical model; Production; Testing; adaptive test; test cost; test optimization; test quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.91
Filename
6114750
Link To Document