Title :
A Fault Criticality Evaluation Framework of Digital Systems for Error Tolerant Video Applications
Author :
Fang, Yuntan ; Li, Huawei ; Li, Xiaowei
Author_Institution :
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
Abstract :
Error tolerance is evolving into a new computing paradigm with further technology scaling, cost constraint, system scalability and emerging applications. Distinguished from defect tolerance and fault tolerance, error tolerance is based on application characteristics and relaxes the constraint of 100 percent functional correctness. From the viewpoint of error tolerance, this paper proposes a framework across multiple layers for fault criticality evaluation. Furthermore, taking an H.264/AVC decoder as an example, fault injection experiments demonstrate that for different functional modules, the faults in them bear different fault criticalities because of their unbalanced effects on applications, the faults in the same module also have diverse fault criticalities. The information that which faults are most critical can aid in test for yield and design for cost-effective fault tolerance. Error control techniques can be used to suppress error propagation and make more faults acceptable.
Keywords :
DRAM chips; fault tolerance; integrated circuit design; integrated circuit testing; logic circuits; modules; video coding; DRAM; H.264-AVC decoder; computing paradigm; cost constraint; defect tolerance; digital system; error control technique; error propagation suppression; error tolerant video application; fault criticality evaluation framework; fault injection experiment; fault tolerance; functional correctness; system scalability; Circuit faults; Decoding; Fault diagnosis; Measurement; PSNR; Transform coding; Video sequences; H.264/AVC decoder; error control; error tolerance; fault acceptability; fault criticality;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.72