DocumentCode
2803527
Title
A Fault Criticality Evaluation Framework of Digital Systems for Error Tolerant Video Applications
Author
Fang, Yuntan ; Li, Huawei ; Li, Xiaowei
Author_Institution
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
329
Lastpage
334
Abstract
Error tolerance is evolving into a new computing paradigm with further technology scaling, cost constraint, system scalability and emerging applications. Distinguished from defect tolerance and fault tolerance, error tolerance is based on application characteristics and relaxes the constraint of 100 percent functional correctness. From the viewpoint of error tolerance, this paper proposes a framework across multiple layers for fault criticality evaluation. Furthermore, taking an H.264/AVC decoder as an example, fault injection experiments demonstrate that for different functional modules, the faults in them bear different fault criticalities because of their unbalanced effects on applications, the faults in the same module also have diverse fault criticalities. The information that which faults are most critical can aid in test for yield and design for cost-effective fault tolerance. Error control techniques can be used to suppress error propagation and make more faults acceptable.
Keywords
DRAM chips; fault tolerance; integrated circuit design; integrated circuit testing; logic circuits; modules; video coding; DRAM; H.264-AVC decoder; computing paradigm; cost constraint; defect tolerance; digital system; error control technique; error propagation suppression; error tolerant video application; fault criticality evaluation framework; fault injection experiment; fault tolerance; functional correctness; system scalability; Circuit faults; Decoding; Fault diagnosis; Measurement; PSNR; Transform coding; Video sequences; H.264/AVC decoder; error control; error tolerance; fault acceptability; fault criticality;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.72
Filename
6114751
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