DocumentCode :
2803721
Title :
Performance of a dual, 1200 V, 400 A, silicon-carbide power MOSFET module
Author :
Urciuoli, Damian ; Green, Ronald ; Lelis, Aivars ; Ibitayo, Dimeji
Author_Institution :
U.S. Army Res. Lab., Adelphi, MD, USA
fYear :
2010
fDate :
12-16 Sept. 2010
Firstpage :
3303
Lastpage :
3310
Abstract :
A dual 1200 V, 400 A power module was built in a half-bridge configuration using 16 silicon-carbide (SiC) 0.56 cm2 DMOSFET die and 12 SiC 0.48 cm2 JBS diode die. The module included high temperature custom packaging and an integrated liquid cooled heat sink while conforming to the footprint and pinout of a commercial dual IGBT package. Die encapsulant was not used, to allow data collection by infrared thermal imaging. The module was DC tested at currents up to 400 A and coolant temperatures up to 100°C. Switching was evaluated in a boost converter at load power levels up to 25 kW and at frequencies up to 30 kHz with coolant temperatures up to 80°C. Acceptable current sharing between MOSFET die was observed over the switching frequency and coolant temperature ranges. Package thermal resistances and MOSFET and diode power losses were characterized. Results were compared to those simulated for a 400 A IGBT module.
Keywords :
infrared imaging; insulated gate bipolar transistors; power MOSFET; semiconductor device packaging; silicon compounds; wide band gap semiconductors; DMOSFET die; IGBT module; IGBT package; JBS diode die; boost converter; current 400 A; die encapsulant; diode power losses; frequency 30 kHz; high temperature custom packaging; infrared thermal imaging; integrated liquid cooled heat sink; package thermal resistances; power 25 kW; power module; silicon-carbide power MOSFET module; temperature 100 C; temperature 80 C; voltage 1200 V; Coolants; Insulated gate bipolar transistors; MOSFET circuits; Power dissipation; Silicon carbide; Switches; Temperature measurement; Power MOSFETs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-5286-6
Electronic_ISBN :
978-1-4244-5287-3
Type :
conf
DOI :
10.1109/ECCE.2010.5618324
Filename :
5618324
Link To Document :
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