DocumentCode :
2803829
Title :
Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C)
Author :
Chandra, Anshuman ; Saikia, Jyotirmoy ; Kapur, Rohit
fYear :
2011
fDate :
20-23 Nov. 2011
Firstpage :
432
Lastpage :
437
Abstract :
Scan compression technology innovation has broken out into solving the data volume problem keeping the test application time gains relatively constant over the generations of technologies. While data volume reductions are important there is a need to take the test application time gains to the next level as it has a direct impact to the cost of test. In this paper an enhancement to combinational compression is described that relies on increasing the encoding bandwidth for aggressive test application time targets. An architecture is described that adds very little area overhead to a combinational compression architecture by reusing the internal scan chains of the design for encoding bandwidth for a set of the test patterns.
Keywords :
automatic test pattern generation; boundary scan testing; adaptive scan-cyclical; area overhead; combinational compression; data volume problem; data volume reductions; encoding bandwidth; internal scan chains; scan compression; test application time barriers; test patterns; Automatic test pattern generation; Bandwidth; Circuit faults; Computer architecture; Encoding; Flip-flops; Vectors; adaptive scan; scan compression; test application time; test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
ISSN :
1081-7735
Print_ISBN :
978-1-4577-1984-4
Type :
conf
DOI :
10.1109/ATS.2011.70
Filename :
6114768
Link To Document :
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