DocumentCode :
2803832
Title :
Teaching advanced test issues in digital electronics
Author :
Ubar, Raimund ; Orasson, Elmet ; Raik, Jaan ; Wuttke, Heinz-Dietrich
Author_Institution :
Eng. Student Services Center, Pittsburgh Univ., PA, USA
fYear :
2005
fDate :
7-9 July 2005
Abstract :
An environment targeted to e-learning is presented for teaching advanced test issues in digital electronics. Digital circuits and systems are getting more and more complex, and in the same time the requirements for the quality of systems are getting higher and higher. This is the reason why the importance of testing as an engineering task has started to grow extremely fast. An environment which consists of a set of Java applets has been created to help the students to improve their understanding of test. The tools support university courses on digital electronics, computer hardware, testing and design for testability to learn by hands-on exercises how to generate test patterns, and how to analyze their quality. The tasks chosen for hands-on training represent simultaneously real research problems, which allow to foster in students critical thinking, problem solving skills and creativity.
Keywords :
Java; computer aided instruction; design for testability; electronic engineering education; teaching; Java applets; advanced test issue; computer hardware; design for testability; digital circuits; digital electronics; digital system; e-learning; hands-on exercise; hands-on training; problem solving skill; student creativity; student critical thinking; test pattern generation; university course; Circuit testing; Design for testability; Digital circuits; Education; Electronic equipment testing; Electronic learning; Hardware; Java; Pattern analysis; Test pattern generators; Digital electronics; E-learning; Living pictures; Physical defects; Test generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology Based Higher Education and Training, 2005. ITHET 2005. 6th International Conference on
Print_ISBN :
0-7803-9141-1
Type :
conf
DOI :
10.1109/ITHET.2005.1560318
Filename :
1560318
Link To Document :
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