DocumentCode :
2803845
Title :
The effect of polymer package materials on device total dose response at low dose rates
Author :
Dowling, S. ; Strobel, D.
Author_Institution :
R. Mil. Coll. of Sci., Cranfield, UK
fYear :
1997
fDate :
15-19 Sep 1997
Firstpage :
259
Lastpage :
264
Abstract :
The effect of eight encapsulant materials on bipolar device total dose response, at low (0.01 rads s-1[Si]) dose rates was studied. Each material was applied to devices with and without their passivation layer. Gain degradation was studied
Keywords :
bipolar transistors; encapsulation; gamma-ray effects; passivation; plastic packaging; semiconductor device packaging; bipolar device; dose rate; encapsulant; gain degradation; passivation layer; polymer package material; radiation environment; total dose response; Ceramics; Costs; Degradation; Educational institutions; Electronics packaging; Materials testing; Passivation; Plastic packaging; Polymers; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
Type :
conf
DOI :
10.1109/RADECS.1997.698904
Filename :
698904
Link To Document :
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