Title :
Physical-Aware Memory BIST Datapath Synthesis: Architecture and Case-Studies on Complex SoCs
Author :
Devanathan, V.R. ; Bhavsar, Sunil ; Mehrotra, Rajat
Author_Institution :
Texas Instrum. India, India
Abstract :
With increasing scaling, it is common to find large SoCs with more than 40M bits of embedded SRAMs constituting more than 75% of total die area [1]. Physical design for such complex SoCs with high speed memories pose numerous challenges for both functional and memory BIST logic. In this paper, we focus on generating physical aware correct-by-constuct memory BIST data path for first pass physical design closure.
Keywords :
SRAM chips; built-in self test; embedded systems; integrated circuit design; integrated circuit testing; system-on-chip; SoC; correct-by-constuct memory BIST data path; datapath synthesis; embedded SRAM; first pass physical design; memory BIST logic; physical aware memory BIST; Built-in self-test; Layout; Pipeline processing; Pipelines; Synchronization; System-on-a-chip;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.102