DocumentCode
2803968
Title
A Robust Solution for Embedded Memory Test and Repair
Author
Darbinyan, K. ; Harutyunyan, G. ; Shoukourian, S. ; Vardanian, V. ; Zorian, Y.
Author_Institution
Synopsys, Mountain View, CA, USA
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
461
Lastpage
462
Abstract
This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and features of the SMS are discussed.
Keywords
embedded systems; integrated circuit testing; random-access storage; SMS; STAR memory system solution; Synopsys DesignWare; embedded memory repair; embedded memory test; self-test and repair memory system solution; Algorithm design and analysis; Built-in self-test; Circuit faults; Conferences; Maintenance engineering; Manufacturing; System-on-a-chip; SMS; built-in self-test; embedded test and repair; memory BIST; test algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.98
Filename
6114774
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