DocumentCode :
2804135
Title :
Study of Moisture Test for Grain Based on Neural Network and Mechanism of Multi-Sensor
Author :
Jiang, Jishun ; Ji, Hua
Author_Institution :
Dept. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
fYear :
2009
fDate :
11-13 Dec. 2009
Firstpage :
1
Lastpage :
4
Abstract :
The multiple sensing mechanism of online moisture test for corn and improved BP neural network was introduced, and hardware structure of moisture test system for corn centering on TMS320F2812 was given. In this paper, dielectric loss factor is measured by the method of orthogonal separation on phase-sensitive detection. Though measuring three parameters of dielectric loss factor, power fluctuations and temperature changes, using BP neural network to construct multi-input single-output model, applying gradient descent method with forgetting factor for parameters adjustment of BP neural network, utilizing the nonlinear mapping ability and learning generalization ability of the BP neural network, and using high precision samples for the training of BP neural network, the mathematic model of moisture test system for corn based on BP neural network was established finally. The sample testing experiment shows that the measurement accuracy obtains a great enhancement comprehensively considering the effect on testing output with the aim sensor characteristic and non-aim parameter.
Keywords :
backpropagation; dielectric loss measurement; moisture measurement; neural nets; sensor fusion; BP neural network; TMS320F2812; backpropagation; corn centering; dielectric loss factor; grain; moisture test; multi-input single-output model; multi-sensor; multiple sensing mechanism; nonlinear mapping; orthogonal separation; phase-sensitive detection; power fluctuations; temperature changes; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Loss measurement; Mathematical model; Moisture; Neural network hardware; Neural networks; Phase measurement; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4507-3
Electronic_ISBN :
978-1-4244-4507-3
Type :
conf
DOI :
10.1109/CISE.2009.5362610
Filename :
5362610
Link To Document :
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