Title :
An IEC 61499 application generator for scan-based industrial controllers
Author :
Lastra, Jose L Martinez ; Godinho, Luis ; Lobov, Andrei ; Tuokko, Reijo
Author_Institution :
Inst. of Production Eng., Tampere Univ. of Technol., Finland
Abstract :
In order to cope with today´s market uncertainties, manufacturing is required to rapidly adapt and react to changes and unpredictable scenarios. These are currently among the main research and development topics in order to reveal new approaches and methodologies to achieve these goals. The Industrial Electrotechnical Commission (IEC) created the IEC 61499 (function block) standard. This standard proposes an open architecture for distributed industrial-process measurement and control systems (IPMCS). The IEC 61499 defines the basic concepts and methodology for the design of modular reusable distributable systems, and paves the way for the new reconfigurable and flexible manufacturing. This paper presents the development of a software tool (IEC 61499 application generator) that enables the deployment of IEC 61499 applications to scan-based embedded controllers. However, the IEC 61499 standard foundations rely on an event-based model. The paper describes an approach to implement an event-based architecture on a scan-based industrial controller.
Keywords :
IEC standards; application generators; control engineering computing; distributed control; embedded systems; flexible manufacturing systems; open systems; IEC 61499 application generator; IEC 61499 standard; IPMCS; Industrial Electrotechnical Commission; distributed industrial-process measurement and control system; event-based architecture; flexible manufacturing; modular reusable distributable system design; open architecture; reconfigurable manufacturing; scan-based embedded industrial controller; software tool development; Application software; Computer architecture; Control systems; Electrical equipment industry; IEC standards; Industrial control; Manufacturing industries; Measurement standards; Research and development; Uncertainty;
Conference_Titel :
Industrial Informatics, 2005. INDIN '05. 2005 3rd IEEE International Conference on
Print_ISBN :
0-7803-9094-6
DOI :
10.1109/INDIN.2005.1560356