Title :
A new approach to bi-axial cross-coupled control
Author :
Yeh, Syh-Shiuh ; Hsu, Pau-Lo
Author_Institution :
Dept. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Cross-coupled control (CCC) has been developed to improve contouring performance for biaxial contour motion systems. In this paper, a new approach to CCC is proposed to efficiently reduce the computation of cross-coupling gains for arbitrary contour commands. The contouring error vector is used here to derive the new CCC approach. The estimated contouring error vector is defined as a vector from the actual position to the nearest point of the line that passes through the reference position tangentially. Thus, the implementation of CCC becomes much more direct with only one simple formulation for cross-coupling gains. Finally, the experimental results on a CNC machining center show that the proposed CCC approach efficiently reduces the contouring error during arbitrary contour motion. Moreover, the calculations required to obtain the variable gains of the CCC are significantly reduced
Keywords :
computerised numerical control; machining; motion control; position control; tracking; CNC machining; biaxial cross-coupled control; contouring error vector; milling machine; motion control; position control; Computer numerical control; Control engineering; Control systems; Electric variables control; Error correction; Gain; Milling machines; Motion control; Open loop systems; Tracking;
Conference_Titel :
Control Applications, 2000. Proceedings of the 2000 IEEE International Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-6562-3
DOI :
10.1109/CCA.2000.897418