Title :
Frequency tuning of self-pulsations in a VCSEL with a voltage-controlled saturable absorber
Author :
Hudgings, J.A. ; Lim, S.F. ; Li, G.S. ; Yuen, W. ; Lau, K.Y. ; Chang-Hasnain, C.J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
Summary form only given. Self-pulsating lasers are extremely useful in a variety of applications, including multimode fiber systems and optical disk readout. It is desirable to attain self-pulsating vertical-cavity surface-emitting lasers (VCSELs) because the surface-normal geometry facilitates two-dimensional array configurations and wafer-scale fabrication. We previously demonstrated on-off control of GHz-range self-pulsations in a VCSEL. In this work, we believe we demonstrate for the first time 700 MHz frequency tuning of self-pulsations in a VCSEL by using an active quantum well absorber integrated in the mirror stack. These pulsations have a 700 kHz relative frequency linewidth. We present theoretical and experimental demonstrations of a novel design criterion, whereby the absorber wavelength is slightly shorter than the lasing wavelength, leading to the negative differential resistance, which is essential to obtaining self-pulsation. By careful device design, the VCSEL can be made to self-pulsate at low absorber biases, GHz-range frequencies, and potentially at high output powers.
Keywords :
laser tuning; optical bistability; optical saturable absorption; quantum well lasers; surface emitting lasers; 700 MHz; active quantum well absorber; frequency tuning; mirror stack; negative differential resistance; relaxation oscillation frequency; self-pulsating VCSEL; self-pulsations; voltage-controlled saturable absorber; Fiber lasers; Frequency; Laser tuning; Optical fibers; Optical surface waves; Optical tuning; Quantum well lasers; Surface emitting lasers; Ultraviolet sources; Vertical cavity surface emitting lasers;
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 1998. OFC '98., Technical Digest
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-55752-521-8
DOI :
10.1109/OFC.1998.657160