• DocumentCode
    2804932
  • Title

    Model updating applied to ultrasound piezoelectric transducers

  • Author

    Piranda, B. ; Steichen, W. ; Ballandras, S.

  • Author_Institution
    Lab. de Phys. et Metrol. des Oscillateurs, CNRS, Besancon, France
  • Volume
    2
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    1057
  • Abstract
    The analysis of ultrasound transducers using piezoelectric actuators requires a precise knowledge of the physical parameters of the materials used to build them. Any error on these parameters induces discrepancies between theoretical and experimental dynamical behaviour. A model updating method based on a first order derivation of the equilibrium equation is proposed. The admittance sensitivity matrix, S Y, with respect to the input parameters is obtained. To decrease the distance Finite Element Model/experiment, the best correction of the material coefficients is calculated by a least square method. This approach is then implemented for a 2-layer bar structure modelled by a 2-D finite elements. It provides a perfect adjustment of the finite element model on the real structure behaviour. Furthermore, these data are introduced in the finite element model (FEM) of another bar structure, built using the same materials. The quasi-perfect agreement between the model response and the experimental data proves the efficiency of the proposed approach
  • Keywords
    finite element analysis; piezoelectric actuators; piezoelectric transducers; ultrasonic transducers; admittance sensitivity matrix; finite element model; input parameters; material coefficients; model updating; physical parameters; piezoelectric actuators; real structure behaviour; ultrasound piezoelectric transducers; Admittance; Biomedical imaging; Biomedical transducers; Electrodes; Equations; Finite element methods; Piezoelectric materials; Piezoelectric transducers; Ultrasonic imaging; Ultrasonic transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
  • Conference_Location
    Sendai
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4095-7
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1998.765010
  • Filename
    765010