DocumentCode :
2804986
Title :
Ultra-low volume ferromagnetic nanodots for field-coupled computing devices
Author :
Kiermaier, J. ; Breitkreutz, S. ; Ju, X. ; Csaba, G. ; Schmitt-Landsiedel, D. ; Becherer, M.
Author_Institution :
Lehrstuhl fur Tech. Elektron., Tech. Univ. Munchen, Munich, Germany
fYear :
2010
fDate :
14-16 Sept. 2010
Firstpage :
214
Lastpage :
217
Abstract :
Focused ion beam irradiation on ferromagnetic Co/Pt films permits controlled modification of the coercivity. This is demonstrated experimentally and mapped to micro-magnetic simulations. Temperature measurements prove the thermal stability of films and nanodots in an application relevant temperature range. For the first time, Extraordinary Hall-Effect measurements are performed at a single-domain ferromagnetic nanodot with a target size of 250 nm in a Hall current device. This verifies the thermal stability and the read-out ability of the magnetic bistable states. Thus, the ultra-low volume magnetic Co/Pt dots fulfill the demands for use in field-coupled logic devices.
Keywords :
Hall effect devices; coercive force; ferromagnetic materials; focused ion beam technology; logic devices; micromagnetics; nanostructured materials; temperature measurement; thermal stability; Hall current device; Hall effect measurements; coercivity; ferromagnetic Co/Pt films; field-coupled computing devices; field-coupled logic devices; focused ion beam irradiation; magnetic bistable states; micromagnetic simulations; read-out ability; size 250 nm; temperature measurements; thermal stability; ultra-low volume ferromagnetic nanodots; Magnetic domain walls; Magnetic domains; Magnetic multilayers; Magnetic resonance imaging; Magnetic separation; Saturation magnetization; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
Conference_Location :
Sevilla
ISSN :
1930-8876
Print_ISBN :
978-1-4244-6658-0
Type :
conf
DOI :
10.1109/ESSDERC.2010.5618385
Filename :
5618385
Link To Document :
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