Title :
Characterization for piezoelectric films using composite resonators
Author :
Cheeke, J.D.N. ; Zhang, Y. ; Wang, Z. ; Lukacs, M. ; Sayer, M.
Author_Institution :
Dept. of Phys., Concordia Univ., Montreal, Que., Canada
Abstract :
A method is developed to determine the elastic and piezoelectric properties of piezoelectric films by the resonance frequency spectrum of a two-layered composite resonator consisting of a film and a substrate plate. The parallel resonance frequencies are determined from the mechanical properties of the two layers only, allowing the density ρˆ and the elastic constant Cˆ33D to be determined independently. The electromechanical coupling coefficient, kt2, can be directly calculated from the distribution of the effective coupling coefficients, keff2, which are given by the parallel and series resonance frequencies of the composite resonator. The accuracy of the method is evaluated by numerical examples
Keywords :
density; dielectric resonance; elastic constants; electromechanical effects; piezoelectric thin films; composite resonators; density; effective coupling coefficients; elastic constant; elastic properties; electromechanical coupling coefficient; mechanical properties; parallel resonance frequencies; piezoelectric films; piezoelectric properties; resonance frequency spectrum; series resonance frequencies; substrate plate; two-layered composite resonator; Acoustic waves; Capacitance; Impedance; Mechanical factors; Physics; Piezoelectric films; Resonance; Resonant frequency; Substrates; Thin film sensors;
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
Print_ISBN :
0-7803-4095-7
DOI :
10.1109/ULTSYM.1998.765036