• DocumentCode
    2805285
  • Title

    Experimental evidence of unconventional room-temperature Quantum Hall effect (RTQHE) in 65nm Si nMOSFETs at very low magnetic fields

  • Author

    Gutiérrez-D, Edmundo A. ; Guarin, Fernando

  • Author_Institution
    Dept. of Electron., INAOE, Puebla, Mexico
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    178
  • Lastpage
    181
  • Abstract
    For the first time we introduce experimental evidence of an anomalous or unconventional Room-Temperature QHE at B fields at and below 50 mT (milli-Teslas). The observed Ultra-High-Conductivity-State (UHCS), and negative channel current are explained in terms of a fractional-dimensional charge transmission, quasi-particle-phonon resonance, and marginal phase (semiconductor-insulator) transition. We believe this work is fundamental to understand the physics of low- and fractional-dimensional devices, which may open a wider and deeper road for Si-based devices applications.
  • Keywords
    MOSFET; elemental semiconductors; magnetic fields; quantum Hall effect; semiconductor-insulator boundaries; silicon; Si; Si nMOSFET; fractional-dimensional charge transmission; magnetic fields; marginal phase transition; negative channel current; quantum Hall effect; quasiparticle-phonon resonance; semiconductor-insulator transition; size 65 nm; temperature 293 K to 298 K; ultra-high-conductivity-state; Current measurement; Hall effect; Logic gates; MOSFETs; Magnetic field measurement; Magnetic fields; Magnetic resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
  • Conference_Location
    Sevilla
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-6658-0
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2010.5618401
  • Filename
    5618401