DocumentCode :
2805285
Title :
Experimental evidence of unconventional room-temperature Quantum Hall effect (RTQHE) in 65nm Si nMOSFETs at very low magnetic fields
Author :
Gutiérrez-D, Edmundo A. ; Guarin, Fernando
Author_Institution :
Dept. of Electron., INAOE, Puebla, Mexico
fYear :
2010
fDate :
14-16 Sept. 2010
Firstpage :
178
Lastpage :
181
Abstract :
For the first time we introduce experimental evidence of an anomalous or unconventional Room-Temperature QHE at B fields at and below 50 mT (milli-Teslas). The observed Ultra-High-Conductivity-State (UHCS), and negative channel current are explained in terms of a fractional-dimensional charge transmission, quasi-particle-phonon resonance, and marginal phase (semiconductor-insulator) transition. We believe this work is fundamental to understand the physics of low- and fractional-dimensional devices, which may open a wider and deeper road for Si-based devices applications.
Keywords :
MOSFET; elemental semiconductors; magnetic fields; quantum Hall effect; semiconductor-insulator boundaries; silicon; Si; Si nMOSFET; fractional-dimensional charge transmission; magnetic fields; marginal phase transition; negative channel current; quantum Hall effect; quasiparticle-phonon resonance; semiconductor-insulator transition; size 65 nm; temperature 293 K to 298 K; ultra-high-conductivity-state; Current measurement; Hall effect; Logic gates; MOSFETs; Magnetic field measurement; Magnetic fields; Magnetic resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
Conference_Location :
Sevilla
ISSN :
1930-8876
Print_ISBN :
978-1-4244-6658-0
Type :
conf
DOI :
10.1109/ESSDERC.2010.5618401
Filename :
5618401
Link To Document :
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