DocumentCode
2806012
Title
Susceptibility, echo time shifts, and T2* considerations for functional magnetic resonance imaging
Author
Sutton, Bradley P. ; Zhuo, Yue
Author_Institution
Bioeng. Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2009
fDate
June 28 2009-July 1 2009
Firstpage
710
Lastpage
713
Abstract
Magnetic susceptibility differences exist near the interface of air/tissue in the ventral brain in fMRI (functional magnetic resonance imaging). These susceptibility differences will not only cause field inhomogeneity and its gradients which will result in image artifacts, but also cause shifts in the echo time for gradients echo acquisitions. The echo time shifts are caused by shifts in the effective k-space trajectory due to the gradients of the field inhomogeneity. Previous work has shown and validated methods for estimating the echo time shift based on the effective k-space trajectory. In this work, we demonstrate that accurate estimation of the R2* decay map (R2*=1/T2*) not only need to account for the field map and its gradients, but also needs to include the echo time shift. These changes in T2* sensitivity are directly related to changes in sensitivity in BOLD (blood oxygenation level dependent) fMRI studies.
Keywords
biomedical MRI; blood; brain; data acquisition; magnetic susceptibility; R2* decay map; T2* considerations; air-tissue interface; blood oxygenation level dependent fMRI; echo time shifts; effective k-space trajectory; field inhomogeneity; functional magnetic resonance imaging; gradients echo acquisition; image artifacts; magnetic susceptibility difference; ventral brain; Biomedical engineering; Blood; Magnetic field measurement; Magnetic fields; Magnetic properties; Magnetic resonance imaging; Magnetic susceptibility; Pixel; Spirals; Tellurium; BOLD fMRI; Echo time shift; Field inhomogeneity; Magnetic susceptibility;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1945-7928
Print_ISBN
978-1-4244-3931-7
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2009.5193146
Filename
5193146
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