DocumentCode :
2806121
Title :
SSN issues with IBIS models
Author :
Varma, Ambrish ; Steer, Michael ; Franzon, Paul
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fYear :
2004
fDate :
25-27 Oct. 2004
Firstpage :
87
Lastpage :
90
Abstract :
A CMOS driver circuit is simulated in HSPICE and compared with an equivalent circuit created with IBIS (input/output buffer information specification) models of the same drivers. The IBIS models are created using the s2ibis tool from North Carolina State University. IBIS model of the driver is also compared against model created using spline functions with finite time difference approximation modeling techniques. The three modeling techniques are analyzed for accuracy in modeling simultaneous switching noise in drivers.
Keywords :
CMOS integrated circuits; SPICE; circuit simulation; driver circuits; equivalent circuits; finite difference time-domain analysis; function approximation; integrated circuit modelling; splines (mathematics); CMOS driver circuit; HSPICE; North Carolina State University; equivalent circuit; finite time difference approximation modeling; input-output buffer information specification models; s2ibis tool; simultaneous switching noise; spline functions; Circuit noise; Circuit simulation; Driver circuits; Integrated circuit modeling; RLC circuits; SPICE; Semiconductor device modeling; Spline; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
Type :
conf
DOI :
10.1109/EPEP.2004.1407554
Filename :
1407554
Link To Document :
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