DocumentCode :
2806231
Title :
Image analysis of Arabidopsis trichome patterning in 4D confocal datasets
Author :
Bensch, R. ; Ronneberger, O. ; Greese, B. ; Fleck, C. ; Wester, K. ; Hülskamp, M. ; Burkhardt, H.
Author_Institution :
Inst. of Comput. Sci., Univ. of Freiburg, Freiburg, Germany
fYear :
2009
fDate :
June 28 2009-July 1 2009
Firstpage :
742
Lastpage :
745
Abstract :
In this article, we present an approach for the automated extraction of quantitative information about trichome patterning on leaves of Arabidopsis thaliana. Time series of growing rosette leaves (4D confocal datasets, 3D + time) are used for this work. At first, significant anatomical structures, i.e. leaf surface and midplane are extracted robustly. Using the extracted anatomical structures, a biological reference coordinate system is registered to the leaves. The performed registration allows to determine intra- as well as inter-series spatiotemporal correspondences. Trichomes are localized by first detecting candidates using Hough transform. Then, local 3D invariants are extracted and the candidates are validated using a Support Vector Machine (SVM).
Keywords :
Hough transforms; biological techniques; feature extraction; filtering theory; image registration; spatiotemporal phenomena; support vector machines; 4D confocal datasets; Arabidopsis thaliana; Arabidopsis trichome patterning; Hough transform; anatomical structures; automated extraction; biological reference coordinate system; growing rosette leaves; image analysis; image registration; inter-series spatiotemporal correspondences; leaf surface; local 3D invariants; support vector machine; Anatomical structure; Biology; Computed tomography; Data mining; Image analysis; Optimized production technology; Robustness; Support vector machines; Surface morphology; X-ray imaging; Arabidopsis trichome patterning; registration; surface extraction; symmetry plane; trichome localization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1945-7928
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2009.5193154
Filename :
5193154
Link To Document :
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