Title :
Stacked regression ensemble for cancer class prediction
Author :
Sehgal, Muhammad Shoaib B ; Gondal, Iqbal ; Dooley, Laurence
Author_Institution :
Fac. of lT, Monash Univ., Churchill, Vic., Australia
Abstract :
Design of a machine learning algorithm as a robust class predictor for various DNA microarray datasets is a challenging task, as the number of samples are very small as compared to the thousands of genes (feature set). For such datasets, a class prediction model could be very successful in classifying one type of dataset but may fail to perform in a similar fashion for other datasets. This paper presents a stacked regression ensemble (SRE) model for cancer class prediction. Results indicate that SRE has provided performance stability for various microarray datasets. The performance of SRE has been cross validated using the k-fold cross validation method (leave one out) technique for BRCA1, BRCA2 and sporadic classes for ovarian and breast cancer microarray datasets. The paper also presents comparative results of SRE with most commonly used SVM and GRNN. Empirical results confirmed that SRE has demonstrated better performance stability as compared to SVM and GRNN for the classification of assorted cancer data.
Keywords :
DNA; cancer; genetics; learning (artificial intelligence); medical computing; neural nets; pattern classification; regression analysis; support vector machines; BRCA1; BRCA2; DNA microarray dataset; GRNN; SVM; breast cancer microarray dataset; cancer class prediction; cancer data classification; class prediction model; gene feature set; k-fold cross validation method; machine learning algorithm design; neural network; ovarian microarray dataset; robust class predictor; sporadic classes; stacked regression ensemble; support vector machine; Australia; Biological neural networks; Breast cancer; Lungs; Machine learning algorithms; Predictive models; Robust stability; Robustness; Support vector machine classification; Support vector machines;
Conference_Titel :
Industrial Informatics, 2005. INDIN '05. 2005 3rd IEEE International Conference on
Print_ISBN :
0-7803-9094-6
DOI :
10.1109/INDIN.2005.1560481