• DocumentCode
    2806658
  • Title

    Image reconstruction of multiphoton microscopy data

  • Author

    Doot, Jared M. ; Eliceiri, Kevin W. ; Nowak, Robert D. ; Willett, Rebecca

  • Author_Institution
    Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
  • fYear
    2009
  • fDate
    June 28 2009-July 1 2009
  • Firstpage
    803
  • Lastpage
    806
  • Abstract
    The techniques introduced in this paper allow for accurate multiscale image reconstruction of multi-photon microscopy data. Multiphoton microscopy (MPM) is a tool for the non-invasive imaging of living organisms and tissue. The data acquired using this technique can contain information about the position, excited state lifetime, and spectra of the observed photons. The small number of photons collected, however, limits the quality of the reconstruction. The multiscale framework in this paper results in an accurate representation of both the intensity and excited state lifetime information. Using a multiscale reconstruction approach based on a penalized likelihood function, the underlying image is more accurately represented as compared to a naive aggregate binning approach.
  • Keywords
    biological tissues; biomedical optical imaging; image reconstruction; image representation; maximum likelihood estimation; medical image processing; multiphoton processes; optical microscopy; accurate image representation; biological tissue; excited state lifetime; image reconstruction; living organism; multiphoton microscopy data; noninvasive imaging; observed photon spectra; penalized likelihood function; Aggregates; Biomedical optical imaging; Data engineering; Fluorescence; Image reconstruction; Noise reduction; Optical imaging; Optical microscopy; Optical signal processing; Spatial resolution; Biomedical microscopy; Maximum likelihood estimation; Multidimensional signal processing; Poisson processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-3931-7
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2009.5193171
  • Filename
    5193171