DocumentCode :
2807105
Title :
On SAT-based Bounded Invariant Checking of Blackbox Designs
Author :
Herbstritt, Marc ; Becker, Bernd
Author_Institution :
Inst. of Comput. Sci., Albert Ludwigs Univ., Freiburg
fYear :
2005
fDate :
Nov. 2005
Firstpage :
23
Lastpage :
28
Abstract :
Design verification by property checking is a mandatory task during circuit design. In this context, bounded model checking (BMC) has become popular for falsifying erroneous designs. Additionally, the analysis of partial designs, i.e., circuits that are not fully specified, has recently gained attraction. In this work we analyze how BMC can be applied to such partial designs. Our experiments show that even with the most simple modelling scheme, namely 01X-simulation, a relevant number of errors can be detected. Additionally, we propose a SAT-solver that directly can handle 01X-logic
Keywords :
integrated circuit design; integrated circuit testing; 01X-logic; blackbox design; bounded invariant checking; bounded model checking; circuit design; design verification; property checking; Automatic logic units; Boolean functions; Chip scale packaging; Circuit synthesis; Computer science; Context modeling; Councils; Data structures; Explosions; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Print_ISBN :
0-7695-2627-6
Type :
conf
DOI :
10.1109/MTV.2005.16
Filename :
4022224
Link To Document :
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