Title :
On SAT-based Bounded Invariant Checking of Blackbox Designs
Author :
Herbstritt, Marc ; Becker, Bernd
Author_Institution :
Inst. of Comput. Sci., Albert Ludwigs Univ., Freiburg
Abstract :
Design verification by property checking is a mandatory task during circuit design. In this context, bounded model checking (BMC) has become popular for falsifying erroneous designs. Additionally, the analysis of partial designs, i.e., circuits that are not fully specified, has recently gained attraction. In this work we analyze how BMC can be applied to such partial designs. Our experiments show that even with the most simple modelling scheme, namely 01X-simulation, a relevant number of errors can be detected. Additionally, we propose a SAT-solver that directly can handle 01X-logic
Keywords :
integrated circuit design; integrated circuit testing; 01X-logic; blackbox design; bounded invariant checking; bounded model checking; circuit design; design verification; property checking; Automatic logic units; Boolean functions; Chip scale packaging; Circuit synthesis; Computer science; Context modeling; Councils; Data structures; Explosions; Sequential circuits;
Conference_Titel :
Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-2627-6
DOI :
10.1109/MTV.2005.16