Title :
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Author :
Bernardi, P. ; Grosso, M. ; Rebaudengo, M. ; Reorda, M. Sonza
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino
Abstract :
Semiconductor manufacturers aim at delivering new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time-to-market. In this paper we propose an Infrastructure IP (I-IP) intended to be a companion for processor cores. The proposed I-IP is an efficient, low-cost and easy-to-adopt solution for supporting the silicon debug of microprocessor cores and of other cores in a SoC, as it reuses the hardware introduced for implementing processor software-based self test (SBST)
Keywords :
automatic test software; integrated circuit manufacture; microprocessor chips; system-on-chip; infrastructure IP; microprocessor cores; semiconductor manufacture; silicon debug; software-based self test; system-on-chip; Automatic testing; Circuits; Microprocessors; Prototypes; Semiconductor device manufacture; Semiconductor device testing; Silicon; Software testing; System-on-a-chip; Time to market;
Conference_Titel :
Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-2627-6
DOI :
10.1109/MTV.2005.11