DocumentCode

2807256

Title

What Is Measured in a Picosecond Optoelectronically Gated Scanning Tunneling Microscope ?

Author

Groeneveld, R.H.M. ; van Kempen, H.

fYear

1996

fDate

8-13 Sept. 1996

Firstpage

201

Lastpage

201

Keywords

Capacitance; Delay effects; Microscopy; Performance evaluation; Solid modeling; Time measurement; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics Conference, 1996. EQEC '96., 1996 European

Conference_Location

Hamburg, Germany

Print_ISBN

0-7803-3171-0

Type

conf

DOI

10.1109/EQEC.1996.561871

Filename

561871