• DocumentCode
    2807262
  • Title

    Fine pitch “NCF-type compliant-bumped COG”

  • Author

    An, Chao-Chyun ; Chang, Shyh-Ming ; Chen, Ming-Yao ; Kao, Kuo-Shu ; Tsang, Jimmy ; Yang, Sheng-Shu ; Chen, Chih ; Lin, Chung-Kuang ; Chen, Ren-Haw ; Chen, Wen-Chih

  • Author_Institution
    Display Technol. Center, Hsinchu
  • fYear
    2007
  • fDate
    1-3 Oct. 2007
  • Firstpage
    14
  • Lastpage
    17
  • Abstract
    Non-Conductive-Film (NCF) type of Chip-on-Glass (COG) bonding method ensures the micro-order direct bonding between the IC electrode and glass substrate electrode. The binding force of the applied adhesive achieves electrical connections between the bumps on the IC chip and the electrodes on the glass substrate. The mathematical calculation results of bump stress and bump deformation are used to identify the environmental temperature range for the given COG bonding structure. Both of the calculation and experimental results demonstrate the feasibility of using the compliant bumps to achieve a high compressive stress, high bump deformation and low as well as stable connection resistance at various environmental temperatures. The 1,000 hrs 85degC/85%RH reliability test result will be indicated.
  • Keywords
    electrodes; fine-pitch technology; integrated circuit bonding; integrated circuit interconnections; COG bonding structure; IC chip; IC electrode; binding force; bump stress; chip-on-glass bonding method; compressive stress; electrical connections; environmental temperature range; fine pitch NCF-type compliant-bumped COG; glass substrate electrode; high bump deformation; micro-order direct bonding; nonconductive-film; time 1000 hr; Bonding; Compressive stress; Electrodes; Glass; Liquid crystal displays; Materials science and technology; Substrates; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology, 2007. IMPACT 2007. International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-1636-3
  • Electronic_ISBN
    978-1-4244-1637-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2007.4433558
  • Filename
    4433558