DocumentCode :
2807341
Title :
High-impedance fault detection and localization in distribution feeders with microprocessor based devices
Author :
Uriarte, Fabian M. ; Centeno, Virgilio
Author_Institution :
Dept. of Electr. Eng., Virginia Tech, VA, USA
fYear :
2005
fDate :
23-25 Oct. 2005
Firstpage :
219
Lastpage :
224
Abstract :
An accurate electrical model for a HIF is implemented to investigate typical patterns in the line´s current that allow for the detection of these faults. Based on the implemented model an algorithm is proposed to detect and localize the occurrence of HIFs using present recloser/sectionalizer technology. The detection algorithm is presented showing the decision criteria for HIF declaration and its discrimination against nominal behavior in distribution feeders of similar harmonic content.
Keywords :
fault diagnosis; power distribution faults; power distribution lines; distribution feeders; high-impedance fault detection; high-impedance fault localization; microprocessor based devices; recloser-sectionalizer technology; Conducting materials; Contacts; Electrical fault detection; Fault detection; Frequency; Harmonic analysis; Microprocessors; Phase detection; Power system protection; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Symposium, 2005. Proceedings of the 37th Annual North American
Print_ISBN :
0-7803-9255-8
Type :
conf
DOI :
10.1109/NAPS.2005.1560528
Filename :
1560528
Link To Document :
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