DocumentCode
2807341
Title
High-impedance fault detection and localization in distribution feeders with microprocessor based devices
Author
Uriarte, Fabian M. ; Centeno, Virgilio
Author_Institution
Dept. of Electr. Eng., Virginia Tech, VA, USA
fYear
2005
fDate
23-25 Oct. 2005
Firstpage
219
Lastpage
224
Abstract
An accurate electrical model for a HIF is implemented to investigate typical patterns in the line´s current that allow for the detection of these faults. Based on the implemented model an algorithm is proposed to detect and localize the occurrence of HIFs using present recloser/sectionalizer technology. The detection algorithm is presented showing the decision criteria for HIF declaration and its discrimination against nominal behavior in distribution feeders of similar harmonic content.
Keywords
fault diagnosis; power distribution faults; power distribution lines; distribution feeders; high-impedance fault detection; high-impedance fault localization; microprocessor based devices; recloser-sectionalizer technology; Conducting materials; Contacts; Electrical fault detection; Fault detection; Frequency; Harmonic analysis; Microprocessors; Phase detection; Power system protection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Symposium, 2005. Proceedings of the 37th Annual North American
Print_ISBN
0-7803-9255-8
Type
conf
DOI
10.1109/NAPS.2005.1560528
Filename
1560528
Link To Document