DocumentCode :
2807374
Title :
An improved unbiased method for diffspect quantification in epilepsy
Author :
Scheinost, Dustin ; Blumenfeld, Hal ; Papademetris, Xenophon
Author_Institution :
Dept. of Diagnostic Radiol., Yale Univ., New Haven, CT, USA
fYear :
2009
fDate :
June 28 2009-July 1 2009
Firstpage :
927
Lastpage :
930
Abstract :
Determining the region of seizure onset is of critical importance for treating medically intractable epilepsy. Comparisons between an ictal and interictal Single Photon Emission Computed Tomography (SPECT) images have been shown to be successful in localizing focal epilepsy. The Ictal-Interictal Subtraction Analysis by Statistical Parametric Mapping (ISAS) algorithm remains one the more successful algorithms for comparing these images. However ISAS is limited by its statistical design. This design introduces a scan order bias in the estimation of the normal variance of sequential SPECT images. We have corrected this bias by estimating the normal variance with a half-normal distribution. In this paper we present an updated algorithm (ISAS HN) based on the original ISAS algorithm with a corrected estimate of the normal variance and an open-source utility for ISAS HN.
Keywords :
brain; medical disorders; medical image processing; single photon emission computed tomography; statistical analysis; ISAS HN; ISAS algorithm; focal epilepsy localisation; half normal distribution; ictal-interictal subtraction analysis; interictal SPECT; medically intractable epilepsy; scan order bias; seizure onset region determinaion; sequential SPECT image variance; single photon emission computed tomography; statistical parametric mapping; unbiased diffspect quantification method; Algorithm design and analysis; Biomedical imaging; Electrodes; Electroencephalography; Epilepsy; Instruction sets; Mathematical model; Medical diagnostic imaging; Single photon emission computed tomography; Surgery; Change detection; Epilepsy; SPECT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1945-7928
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2009.5193205
Filename :
5193205
Link To Document :
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