Title :
Are on-chip power-ground planes really needed? A signal integrity perspective
Author :
Elfadel, I.M. ; Feldmann, P. ; Chen, H. ; Ostapko, D.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
We use the on-chip bus characterization methodology of to study the impact of the on-chip power distribution system on the signal integrity of a 12-line bus. We compare two power supply systems implemented in the same Cu BEOL stack: an entirely grid-based system and a system similar to in that it contains one metal layer dedicated to Vdd and one metal layer dedicated to Vss. We show that while the dedicated power/ground layers do contribute to the mitigation of the inductive and return-path impedance effects, the ultimate signal integrity of the on-chip bus depends on the interplay between resistive losses, electromagnetic couplings (capacitive and inductive), and the driving and receiving circuitry.
Keywords :
low-power electronics; microprocessor chips; power distribution; system buses; Cu BEOL stack; driving circuitry; electromagnetic couplings; grid based system; on-chip bus characterization; on-chip power distribution system; on-chip power-ground planes; power supply system; receiver circuitry; signal integrity; Clocks; Crosstalk; Frequency; Integrated circuit interconnections; Microprocessors; Power distribution; Power supplies; Signal analysis; Signal processing; System-on-a-chip;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
DOI :
10.1109/EPEP.2004.1407618