DocumentCode :
2807920
Title :
Application of the enlarged cell method (ECM) to EMI/EMC problems
Author :
Xiao, Tian ; Liu, Qing Huo ; He, Jiangqi
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear :
2004
fDate :
25-27 Oct. 2004
Firstpage :
333
Lastpage :
336
Abstract :
Conductors play an important role in the EMI/EMC problem. However, the conventional finite-difference time-domain (FDTD) method is known to produce significant staircasing errors when applied to conductors. In the past few years, many researchers have been using conformal FDTD methods to reduce this staircasing error. As a side effect, however, the time step size in these conformal FDTD (CFDTD) methods often becomes more restrictive because of the reduced effective grid size near the conductor boundary. An enlarged cell method is applied to solve EMI/EMC problems. We show that the ECM is highly accurate compared to the conventional FDTD method, and is three times faster than the conformal FDTD method because the time step size in ECM remains the same as in the FDTD method. Large-scale EMI/EMC problems have been solved with the ECM on a PC.
Keywords :
conductors (electric); electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; microcomputers; conductor boundary; conformal FDTD methods; enlarged cell method; finite difference time domain method; large scale EMC problem; large scale EMI problem; personal computer; staircasing error reduction; Conducting materials; Conductors; Degradation; Electrochemical machining; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Large-scale systems; Stability; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
Type :
conf
DOI :
10.1109/EPEP.2004.1407626
Filename :
1407626
Link To Document :
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