DocumentCode
2807920
Title
Application of the enlarged cell method (ECM) to EMI/EMC problems
Author
Xiao, Tian ; Liu, Qing Huo ; He, Jiangqi
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear
2004
fDate
25-27 Oct. 2004
Firstpage
333
Lastpage
336
Abstract
Conductors play an important role in the EMI/EMC problem. However, the conventional finite-difference time-domain (FDTD) method is known to produce significant staircasing errors when applied to conductors. In the past few years, many researchers have been using conformal FDTD methods to reduce this staircasing error. As a side effect, however, the time step size in these conformal FDTD (CFDTD) methods often becomes more restrictive because of the reduced effective grid size near the conductor boundary. An enlarged cell method is applied to solve EMI/EMC problems. We show that the ECM is highly accurate compared to the conventional FDTD method, and is three times faster than the conformal FDTD method because the time step size in ECM remains the same as in the FDTD method. Large-scale EMI/EMC problems have been solved with the ECM on a PC.
Keywords
conductors (electric); electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; microcomputers; conductor boundary; conformal FDTD methods; enlarged cell method; finite difference time domain method; large scale EMC problem; large scale EMI problem; personal computer; staircasing error reduction; Conducting materials; Conductors; Degradation; Electrochemical machining; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Large-scale systems; Stability; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN
0-7803-8667-1
Type
conf
DOI
10.1109/EPEP.2004.1407626
Filename
1407626
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