DocumentCode :
2807994
Title :
Predicting capacitor reliability in a module-integrated photovoltaic inverter using stress factors from an environmental usage model
Author :
Castillo, Samantha J. ; Balog, Robert S. ; Enjeti, Prasad
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, PA, USA
fYear :
2010
fDate :
26-28 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
In order for photovoltaic energy to achieve grid parity, the levelized cost of energy (the total lifetime cost) must be reduced. This is not possible by addressing only the solar cells since the inverter is a critical weak link in the system. It is well known that aluminum electrolytic capacitors, ubiquitous in power electronic converters, have end-of-life and failure modes that are sensitive to environmental conditions including temperature. In an ACPV system the inverter is mounted on the photovoltaic (PV) module which exposes the capacitors to potentially elevated temperatures which can increase their failure rate. Existing techniques of derating the capacitors increase the cost of the inverter, so they must be applied judiciously. This paper presents a technique to more accurately compute the MTBF of the capacitors used in a PV inverter by utilizing a thermal model of the PV module to predict operating temperature.
Keywords :
electrolytic capacitors; power convertors; power grids; power system reliability; solar cells; aluminum electrolytic capacitors; capacitor reliability; environmental usage; grid parity; module-integrated photovoltaic inverter; photovoltaic energy; power electronic converters; solar cells; stress factors; thermal model; Capacitors; Copper; Inverters; Temperature sensors; Warranties;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
North American Power Symposium (NAPS), 2010
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-8046-3
Type :
conf
DOI :
10.1109/NAPS.2010.5618955
Filename :
5618955
Link To Document :
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