Title :
IEE Colloquium on `Design and Test of Mixed Analogue and Digital Circuits´ (Digest No.154)
Abstract :
The following topics were dealt with: test problems; logic analysers; A/D convertors; mixed-mode simulation; A1; fault diagnosis
Keywords :
application specific integrated circuits; integrated circuit testing; monolithic integrated circuits; A/D convertors; A1; fault diagnosis; logic analysers; mixed-mode simulation; test problems;
Conference_Titel :
Design and Test of Mixed Analogue and Digital Circuits, IEE Colloquium on
Conference_Location :
London
