• DocumentCode
    2808222
  • Title

    The use of modified oxide process for lead-free application

  • Author

    Lin, Williams ; Lin, David ; Hsu, Keven ; Chang, K.S. ; Chu, Charley

  • Author_Institution
    Atotech Taiwan Ltd., Taoyuan
  • fYear
    2007
  • fDate
    1-3 Oct. 2007
  • Firstpage
    234
  • Lastpage
    237
  • Abstract
    The laws legislated recently such as RoHs and WEEE restrain strictly the use of lead and cause the revolution in SMT soldering technology. Compared to the traditional tin-lead soldering, the reflow temperature of lead-free soldering is 30degC higher and the total thermal mass also increases. The tremendous change leads to large amount of panel scrap and compensation between PCB manufacturer and SMT house. Delamination is a common issue for base material manufactures after conducting lead-free soldering. It might be caused by the lamination material itself or the insufficient adhesion between resin and copper foil. In this study, we focus on the oxide pretreatment prior to lamination, and find the proper condition, including the properties of base materials and immersion duration in brown oxide bath, to enhance the adhesion between copper foil and resin to against the higher thermal shock.
  • Keywords
    RoHS compliance; printed circuit manufacture; reflow soldering; surface mount technology; thermal shock; PCB manufacturer; RoHs; SMT house; SMT soldering technology; WEEE; copper foil; delamination; lead-free soldering; modified oxide process; reflow temperature; thermal mass; thermal shock; tin-lead soldering; Adhesives; Conducting materials; Copper; Electronic waste; Environmentally friendly manufacturing techniques; Lamination; Lead compounds; Resins; Soldering; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology, 2007. IMPACT 2007. International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-1636-3
  • Electronic_ISBN
    978-1-4244-1637-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2007.4433606
  • Filename
    4433606