DocumentCode :
2808258
Title :
Point-Spread Function retrieval for fluorescence microscopy
Author :
Pankajakshan, Praveen ; Blanc-Féraud, Laure ; Kam, Zvi ; Zerubia, Josiane
Author_Institution :
ARIANA Project Team, INRIA/I3S, Sophia Antipolis, France
fYear :
2009
fDate :
June 28 2009-July 1 2009
Firstpage :
1095
Lastpage :
1098
Abstract :
In this paper we propose a method for retrieving the Point Spread Function (PSF) of an imaging system given the observed image sections of a fluorescent microsphere. Theoretically calculated PSFs often lack the experimental or microscope specific signatures while empirically obtained data are either over sized or (and) too noisy. The effect of noise and the influence of the microsphere size can be mitigated from the experimental data by using a Maximum Likelihood Expectation Maximization (MLEM) algorithm. The true experimental parameters can then be estimated by fitting the result to a model based on the scalar diffraction theory with lower order Spherical Aberration (SA). The algorithm was tested on some simulated data and the results obtained validate the usefulness of the approach for retrieving the PSF from measured data.
Keywords :
aberrations; biological techniques; expectation-maximisation algorithm; fluorescence; light diffraction; optical microscopy; optical transfer function; MLEM algorithm; fluorescence microscopy; fluorescent microsphere; imaging system PSF retrieval; low order spherical aberration; maximum likelihood expectation maximization; microsphere size effects; noise effects; observed image sections; point spread function; scalar diffraction theory; true experimental parameters; Biological cells; Deconvolution; Detectors; Diffraction; Fluorescence; Image retrieval; Information retrieval; Maximum likelihood estimation; Microscopy; Testing; Expectation Maximization algorithm; deconvolution; fluorescence microscopy; point-spread function; spherical aberration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1945-7928
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2009.5193247
Filename :
5193247
Link To Document :
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