• DocumentCode
    2808322
  • Title

    Scattering by conductor-backed dielectric gaps

  • Author

    Moore, J. ; Ling, H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • fYear
    1991
  • fDate
    24-28 June 1991
  • Firstpage
    272
  • Abstract
    The electromagnetic scattering from two-dimensional conductor-backed dielectric gaps was studied previously, but the isolated contributions from the gap and surface wave phenomena were not extracted. In the present work, two different approaches are implemented to attack the dielectric gap problem and extract the diffracted field and surface wave contributions of the gap. The first approach uses a boundary integral equation formulation. To facilitate numerical implementation, the specular solution and the surface wave contribution are removed from the boundary integral equation. Consequently, the discretization domain of the infinite structure is reduced to a localized region near the gap. The second approach is a spectral integral formulation. This formulation utilizes the Green´s function for the conductor-backed dielectric in a volume integral equation. The results of these two approaches are validated against each other and the surface-wave excitation coefficients at the gap are extracted.<>
  • Keywords
    Green´s function methods; boundary-value problems; dielectric properties of substances; electromagnetic wave scattering; integral equations; EM scattering; Green´s function; boundary integral equation; conductor-backed dielectric gaps; diffracted field; electromagnetic scattering; excitation coefficients; spectral integral formulation; specular solution; surface wave; volume integral equation; Coatings; Conducting materials; Dielectrics; Electromagnetic scattering; Green´s function methods; Integral equations; Moment methods; Polarization; Slabs; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1991. AP-S. Digest
  • Conference_Location
    London, Ontario, Canada
  • Print_ISBN
    0-7803-0144-7
  • Type

    conf

  • DOI
    10.1109/APS.1991.174829
  • Filename
    174829