• DocumentCode
    2808425
  • Title

    Reliability of high Tg copper clad laminate for lead-free assembly

  • Author

    Liu, Ado ; Chen, Jeng-i

  • Author_Institution
    ITEQ Corp., Taoyuan
  • fYear
    2007
  • fDate
    1-3 Oct. 2007
  • Firstpage
    284
  • Lastpage
    287
  • Abstract
    A general property review of high Tg copper clad laminate materials is reported. The characteristics of both dicy-cured and PN-cured materials are discussed. The properties of PN-cured materials are compared with those of conventional dicy-cured high Tg materials. These PN-cured materials have shown enhanced thermal resistance. In addition, a low thermal expansion high Tg material is also presented. The advantages of lowering thermal expansion of a material are reported based on several experimental results. The properties of laminates studied include Tg, thermal decomposition temperature, thermal expansion, and time-to-delamination, drilling processability, and interconnect stress test. The results of the tested materials are presented and the recommendation for material selection is also discussed.
  • Keywords
    assembling; copper; curing; delamination; laminates; pyrolysis; reliability; thermal expansion; thermal resistance; PN-cured materials; dicy-cured materials; drilling processability; high Tg copper clad laminate materials; interconnect stress test; lead-free assembly; thermal decomposition temperature; thermal expansion; thermal resistance; time-to-delamination; Assembly; Copper; Drilling; Environmentally friendly manufacturing techniques; Laminates; Temperature; Thermal decomposition; Thermal expansion; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology, 2007. IMPACT 2007. International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-1636-3
  • Electronic_ISBN
    978-1-4244-1637-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2007.4433618
  • Filename
    4433618